Search results for "solid surfaces"

showing 2 items of 2 documents

Deformation-Free Topography from Combined Scanning Force and Tunnelling Experiments

1993

We show that by measuring force and stiffness on a constant-current scanning tunnelling microscopy (STM) contour a deformation-free topography can be extracted. With reference to mono- and bicomponent self-assembled monolayers, we find that the characteristic depression pattern and the protrusions on a multicomponent film found in STM are to a great extent due to electronic effects.

Materials sciencebusiness.industryELECTRON MICROSCOPY DETERMINATIONS (INC SCANNING TUNNELING MICROSCOPYMECHANICAL ANDGeneral Physics and AstronomyStiffnessSOLID-SOLID INTERFACES (INC BICRYSTALS)Deformation (meteorology)METHODS)law.inventionOpticslawMicroscopyMonolayermedicineACOUSTICAL PROPERTIES OF SOLID SURFACES AND INTERFACESThin filmComposite materialScanning tunneling microscopemedicine.symptombusinessQuantum tunnellingEurophysics Letters (EPL)
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Near-surface defect profiling with slow positrons: Argon-sputtered Al(110).

1985

We report on slow-positron measurements of atomic defect distribution near a solid surface. Defects are produced by argon-ion bombardment of an Al(110) surface in ultrahigh vacuum. Defect profiles have a typical width of 15–25 Å and contain a broader tail extending to 50–100 Å. The defect density at the outermost atomic layers saturates at high argon fluences to a few atomic percent, depending on sputtering conditions. Defect production rate at >1 keV Ar+ energies is typically 1–5 vacancy-interstitial pairs per incident ion. Molecular-dynamics simulations of the collision cascade predict similar defect distributions. Peer reviewed

Surface (mathematics)Profiling (computer programming)solid surfacesPositronMaterials scienceArgonchemistryPhysicsPhysics::Atomic and Molecular Clusterschemistry.chemical_elementslow positronsAtomic physicsPositron annihilationPhysical review. B, Condensed matter
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